JEM-2100Plus 透射电子显微镜 + TEMCenter
JEM-2100Plus 是一款多功能透射电子显微镜（TEM），
作为经典款 JEM-2100 通用型电镜的升级换代机型，
其融合了经业界验证的 JEM-2100 光学系统，
配备先进控制系统与增强型多功能模块，
显著提升操作便捷性与用户体验。
JEM-2100Plus Transmission Electron Microscope + TEMCenter
The JEM-2100Plus is a multipurpose transmission electron microscope (TEM)
developed as the successor to the industry-proven JEM-2100 platform.
It integrates the inherited optical excellence of the JEM-2100
with an advanced control system and enhanced functional versatility,
delivering significantly improved operational accessibility and user experience
规格表
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参数类别
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UHR模式
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HR模式
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HT模式
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CR模式
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HC模式
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晶格分辨率
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0.14 nm
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0.14 nm
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0.14 nm
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0.14 nm
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0.14 nm
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点分辨率
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0.194 nm
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0.23 nm
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0.25 nm
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0.27 nm
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0.31 nm
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STEM明场像分辨率
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1.0 nm（边缘清晰度法）
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加速电压
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80, 100, 120, 160, 200 kV
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放大倍率
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TEM模式
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STEM模式
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高倍模式(MAG)
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2,000–1,500,000× (UHR/HR)
1,200,000× (HT)
1,000,000× (CR)
8,000,000× (HC)
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20,000–2,000,000×
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低倍模式
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30–6,000× (标准)
30–2,000× (选配)
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100–15,000×
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选区高倍(SA MAG)
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6,000–600,000× (UHR/HR)
5,000–600,000× (HT)
5,000–400,000× (CR)
8,000–800,000× (HC)
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—
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技术注释
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UHR：超高分辨率模式 | HR：高分辨率模式 | HT：高温模式 | CR：共轭变焦模式 | HC：高对比度模式
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STEM分辨率测试条件：200 kV加速电压，标准明场探测器
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放大倍率范围受工作模式及选配组件影响
(ISO-Compliant Technical Specs)
JEM-2100Plus Transmission Electron Microscope Specifications
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Parameter
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UHR
|
HR
|
HT
|
CR
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HC
|
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Lattice Resolution
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0.14 nm
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0.14 nm
|
0.14 nm
|
0.14 nm
|
0.14 nm
|
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Point Resolution
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0.194 nm
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0.23 nm
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0.25 nm
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0.27 nm
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0.31 nm
|
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STEM BF Resolution
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1.0 nm (edge-edge)
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Accelerating Voltage
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80, 100, 120, 160, 200 kV
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Magnification
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TEM Mode
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STEM Mode
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High MAG
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2,000–1,500,000× (UHR/HR)
1,200,000× (HT)
1,000,000× (CR)
8,000,000× (HC)
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20,000–2,000,000×
|
|
Low MAG
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30–6,000× (Standard)
30–2,000× (Optional)
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100–15,000×
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SA MAG
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6,000–600,000× (UHR/HR)
5,000–600,000× (HT)
5,000–400,000× (CR)
8,000–800,000× (HC)
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